Anna Fröjdh

Spara favorit

Publikationer

Artiklar i tidskrifter

Fröjdh, A. , Thungstrom, G. , Frojdh, C. & Petersson, S. (2011). An optimized system for measurement of radon levels in buildings by spectroscopic measurement of radon progeny. Journal of Instrumentation, vol. 6: 12, ss. art. no. C12018  

Fröjdh, A. , Fröjdh, E. , Thungström, G. , Fröjdh, C. & Norlin, B. (2011). Processing and characterization of a MEDIPIX2-compatible silicon sensor with 220 mu m pixel size. Nuclear Instruments and Methods in Physics Research Section A, vol. 633: Suppl 1, ss. S78-S80.  

Fröjdh, E. , Fröjdh, A. , Norlin, B. & Fröjdh, C. (2011). Spectral response of a silicon detector with 220 mu m pixel size bonded to MEDIPIX2. Nuclear Instruments and Methods in Physics Research Section A, vol. 633: Supplement 1, ss. S125-S127.  

Konferensbidrag

Fröjdh, A. , Thungström, G. , Fröjdh, C. & Petersson, S. (2010). An alpha particle detector for measuring radon levels. I Proceedings of Nuclear Science Symposium Conference Record (NSS/MIC), 2010.. S. 460--461.  

Fröjdh, A. , Thungström, G. , Fröjdh, C. & Petersson, S. (2010). Measurement of radon levels in buildings by spectroscopic measurement of radon progeny. I Proceedings of Nuclear Science Symposium Conference Record (NSS/MIC), 2010.. S. 1229--1231.  

Norlin, B. , Fröjdh, E. , Krapohl, D. , Fröjdh, A. , Thungström, G. & Fröjdh, C. (2010). Spectroscopic X-Ray Imaging Using a Pixelated Detector with Single Photon Processing Readout. I Proceedings of 2010 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE. (IEEE Nuclear Science Symposium Conference Record). S. 1074--1078.

Norlin, B. , Fröjdh, C. , O'Nils, M. , Fröjdh, A. , Fröjdh, E. & Thungström, G. (2009). Energy Resolved X-ray Imaging as a Tool for Characterization of Paper Coating Quality. I IEEE Nuclear Science Symposium Conference Record 2009. (IEEE Nuclear Science Symposium Conference Record). S. 1703--1706.  

Fröjdh, C. , Norlin, B. , Jakubek, J. , Holy, T. , Fröjdh, A. & Fröjdh, E. (2007). Characterization of area sensitivity in 55 um pixellated CdTe X-ray imaging detectors. I IEEE Nuclear Science Symposium Conference Record. New York : . S. 1234--1236.