Atomic Force Microscope (AFM)

Atomic force microscopy (AFM) uses an extremely fine tip to “feel” surfaces at the atomic level and create high-resolution images of a material’s topography. The technique measures forces between the tip and the sample’s atoms, providing information about surface properties such as hardness or friction.

In materials science, AFM is used to study nanostructures, such as nanoparticles or semiconductor surfaces, to optimize their properties in applications like solar cells or catalysts. AFM is invaluable for understanding materials at the nanoscale, which is crucial for the development of new materials in electronics and nanotechnology.

Our instrument is also fully equipped with electrical characterization capabilities in addition to topographical measurement.